• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
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    • 专利摘要:
    Apparatus (100) for determining indicative information for a particle size and / or particle shape of particles in a sample, the apparatus (100) comprising an electromagnetic radiation source (102) for generating electromagnetic primary radiation (108), an electromagnetic radiation detector (104) for Detecting secondary electromagnetic radiation (110) generated by interaction of the primary electromagnetic radiation (108) with the sample, and detecting means (106) for determining the particle size and / or particle shape indicative information based on the detected secondary electromagnetic radiation (110) is set up, wherein the determination device (106) is designed to selectively selectively (112) the information by means of an identification and size determination and / or shape determination of the particles on a detector image generated from the electromagnetic secondary radiation (110) u determine, and / or the second information (114) from temporal changes of the electromagnetic secondary radiation (110) to determine between generated at different detection times detector images.
    公开号:AT515577A2
    申请号:T50184/2014
    申请日:2014-03-12
    公开日:2015-10-15
    发明作者:
    申请人:Anton Paar Gmbh；
    IPC主号:
    专利说明:

    Common beam path for determining particle information by direct image evaluation and differential image analysis
    The invention relates to an apparatus and a method for determining particle size and / or particle shape of particles in a sample of indicative information, an associated storage medium and a software program. The invention further relates to an apparatus and a method for determining indicative information for a zeta potential of particles in a sample, an associated storage medium and a software program.
    Dynamic Image Analysis (DIA) allows dispersions (suspensions, emulsions, aerosols) to be analyzed for particle size and particle shape. Within the scope of this application, the term particles also includes droplets such as occur, for example, in emulsions or aerosols. Since the DIA is an optical and imaging process, the lower measurement limit (smallest reproducible particle size) is limited by the physical resolution limit (approximately half the wavelength of the light with a correspondingly large numerical aperture of the objective). With DIA, it is also possible to determine the shape of the particles. Thus, a meaningful size distribution can be calculated. Related art is disclosed in EP 0,507,746, US 3,641,320 and US 6,061,130.
    In the field of particle characterization, the measurement limit for particle size in imaging measurement methods has heretofore been characterized by a combination with "Laser Obscuration". (LOT, company Ankersmid - EyeTech) or NanoparticleTracking (NTA, company NanoSight - NS300). However, both technologies have the disadvantage that individual particles are measured and therefore the present particle concentration must be very low. In addition, a good number of particles must be analyzed for good statistics, which in turn significantly increases the measurement time. LOT also has the
    Disadvantage that the optical design is not compatible with a typical DIA construction.
    Another technology is described in "Differential Dynamic Microscopy: Probing Wave Vector Dependent Dynamics with a Microscope", Roberto Cerbino, Veronique Trappe, Physical Review Letters 100, 188102 (2008) and "Scattering Information obtained by optical microscopy: Differential dynamic microscopy and beyond", Fabio Giavazzi , Doriano Brogioli, Veronique Trappe, Tommaso Bellini, Roberto Cerbino, Physical Review E 80, 031403 (2009). This is called differential dynamic microscopy, hereinafter referred to as DDM. By means of DDM it is possible to measure the size of particles in liquids (suspensions) by analyzing their own motion (Brownian motion). Since Brownian molecular motion depends on temperature, it is necessary to ensure a constant temperature of the sample during the measurement.
    Further prior art is disclosed in DE 10 2009 014 080 and WO2013 / 021185.
    It is an object of the present invention to enable the determination of particle size and / or particle shape of particles in a sample of indicative information with high accuracy for a wide range of samples and over a wide range of sizes.
    It is another object of the present invention to enable detection of zeta potential of particles in a sample of indicative information with high sensitivity even at small particle sizes.
    These objects are achieved by the subject matters having the features according to the independent claims. Further embodiments are shown in the dependent claims.
    According to an embodiment of the present invention there is provided an apparatus for determining particle size and / or particle shape of particles in a sample of indicative information, the apparatus comprising an electromagnetic radiation source for generating electromagnetic primary radiation, an electromagnetic radiation detector for detecting electromagnetic secondary radiation generated by interaction of the primary electromagnetic radiation the sample is generated and has a detection means arranged to determine the particle size and / or particle shape indicative information (for example, a particle size distribution) based on the detected secondary electromagnetic radiation, the detection means being adapted to selectively select the information (the selection being based, for example, on a user selection or based on an off dependent on the examined sample choice) firstly by means of identification and size determination and / or shape determination of the particles on a detector image generated from the electromagnetic secondary radiation, and / or secondly to determine the information from temporal changes between detector images generated from the electromagnetic secondary radiation at different detection times.
    According to another embodiment of the present invention, there is provided a method of determining indicative information for a particle size and / or particle shape of particles in a sample, wherein the method generates electromagnetic primary radiation, detects electromagnetic secondary radiation generated by interaction of the primary electromagnetic radiation with the sample, and the information indicative of particle size and / or particle shape is determined based on the detected secondary electromagnetic radiation, wherein the information is selectively determined first by means of identification and sizing and / or shape determination of the particles on a detector image generated from the electromagnetic secondary radiation, and / or the information secondly from temporal variations between detector images generated from the electromagnetic secondary radiation to different Detek tion times.
    In a storage medium according to an embodiment of the present invention, a program for determining particle size and / or particle shape of particles in a sample indicative information is stored, which program, when executed by one or more processors, has the above-described process steps. performs.
    A software program (formed, for example, by one or more computer program elements) according to one embodiment of the present invention for determining indicative information for a particle size and / or particle shape of particles in a sample comprises (or performs or controls) the above-described method steps ) when executed by one or more processors of the control device.
    According to another embodiment of the present invention, there is provided an apparatus for determining zeta potential of particles in a sample of indicative information, the apparatus comprising an electromagnetic radiation source for generating primary electromagnetic radiation, electric field generating means for generating an electric field in the sample, an electromagnetic radiation detector for detecting electromagnetic energy Secondary radiation, which is generated by the interaction of the electromagnetic primary radiation with the sample in the electric field, and a detecting means, which is arranged for determining the information indicative of the zeta potential based on the detected secondary electromagnetic radiation, wherein the determining means is adapted, the information indicative of the zeta potential of temporal changes between out of the electromagnetic secondary road determine generated detector images at different detection times.
    According to another embodiment of the present invention, there is provided a method of determining zeta potential of particles in a sample of indicative information, wherein the method generates electromagnetic primary radiation, generates an electric field in the sample, detects secondary electromagnetic radiation caused by interaction of the primary electromagnetic radiation the sample is generated in the electric field, and the information indicative of the zeta potential is determined based on the detected electromagnetic secondary radiation, the information indicative of the zeta potential being determined from temporal variations between detector images generated from the electromagnetic secondary radiation at different detection times.
    In a storage medium according to an embodiment of the present invention, a program for determining zeta potential of particles in a sample indicative information is stored, which program, when executed by one or more processors, performs the above-described process steps.
    A software program (formed, for example, by one or more computer program elements) according to an embodiment of the present invention for determining indicative information for a zeta potential of particles in a sample comprises (or performs) the method steps described above is executed by one or more processors of the control device.
    Embodiments of the present invention can be realized both by means of a computer program, that is to say a software, and by means of one or more special electrical circuits, that is to say in hardware or in any hybrid form, that is to say by means of software components and hardware components.
    According to a first exemplary embodiment of the present invention, a combination of a particle size and / or shape determination can be implemented synergistically by analyzing static detector images on the one hand (in particular by means of dynamic image analysis, dynamic image analysis (DIA)) and a corresponding determination by means of an analysis of density fluctuations on the basis of differential image data on the other hand (in particular by means of differential dynamic microscopy, Differential Dynamic Microscopy (DDM)). The combination of these two complementary analysis techniques allows for an increase in the measurable size range to small particles (for example, up to about 20 nm), thereby eliminating one of the major disadvantages of DIA compared to competing technologies (e.g., static light scattering). There is a size range (for example, from about 500 nm to 10 pm particle size) in which both DIA and DDM can be used. In this area, the combination of DIA with DDM provides information that is not accessible by either method alone. According to the invention, there is provided a device that is capable of determining the information indicative of particle size and / or particle shape by means of detector image analysis, and the like is able to determine the information by differential image analysis, ie to carry out the determination of the information by means of two separate investigations, of which in one particular application, optionally only one, only the other or both may be used.
    According to a second embodiment of the present invention, a determination of the zeta potential or charge of particles by means of an analysis of density fluctuations on the basis of differential image data (in particular by means of differential dynamic microscopy, Differential Dynamic Microscopy (DDM)) is made possible. When an electric field is applied to the sample with the particles, electrophoretic movement of the particles, which allows differential image analysis to obtain information about the zeta potential or charge of the particles, respectively. Under the zeta potential, the electric potential (also called
    Coulomb potential) on a moving particle in a sample (in particular a suspension) are understood. The electrical potential describes the ability of a field caused by an electric charge of the particle to apply force to other charges or charged particles, respectively.
    Hereinafter, additional exemplary embodiments of the apparatus, methods, storage media, and software programs will be described.
    According to an exemplary embodiment, the determining device may be configured to determine the information from the detector image generated from the secondary electromagnetic radiation by means of dynamic image analysis (DIA). According to such an embodiment, static detector images of the particles are taken. Each one of these detector images is then analyzed to recognize particles on the respective detector image (for example, by image processing methods) (using, for example, a threshold method using pattern recognition) and subsequently parameters (such as a particle diameter and / or a particle shape) based on the individual ones Detected particles are determined. In this way, when a sufficient number of detector images (for example between 100 and 10,000 detector images) having a sufficient number of respective particles (for example between 5 and 100) have been analyzed, the result can be output as a particle size distribution. This method is independent of particle fluctuations, such as brown-field molecular motion.
    According to an exemplary embodiment, the determining device may be configured to determine the information from the temporal changes between the detector images by means of Differential Dynamic Microscopy (DDM). Differential Dynamic Microscopy first produces differential images from a plurality of detector images, on which changes in particle positions due to particle fluctuations are detectable. These difference images can then be subjected to Fourier analysis. The result of the Fourier analysis can be averaged for the different difference images. The diffusion rate of the particles is a function of the viscosity of the solvent of the sample, the temperature and the particle size. Information regarding the rate of diffusion can be obtained from the result of the Fourier analysis and used at known temperature and solvent viscosity to infer the particle sizes. Since Differential Dynamic Microscopy does not rely on the identification of individual particles on a detector image, this methodology also allows the sizing of substantially smaller particles.
    According to an exemplary embodiment, the determining device may be configured to determine the first and the second determination of the information for at least one predeterminable partial range of particle sizes (in particular in a range between approximately 100 nm and approximately 20 pm, more particularly in a range between approximately 500 nm and approximately 10 pm). perform. The complementarity of the particle size determination directly from individual detector images on the one hand and by time difference image analysis on the other hand allows, especially in the said intermediate area, the discovery and analysis of phenomena that are inaccessible to each one of these methods alone. As a result, an examination focusing on the mentioned size range or a portion thereof is particularly informative.
    According to an exemplary embodiment, the determining device may be designed to carry out the information for particle sizes above the predefinable partial range of particle sizes only by means of the first determination and / or to carry out the information for particle sizes below the predeterminable partial range of particles only by means of the second determination. The particle size-specific use of the first or second determination method makes it possible to extend the sensitivity range of determinable particle sizes over conventional devices. The particle recognition on detector images is limited to particle sizes that are still to be resolved from the detector image and fails at particle sizes below certain resolution limits. On the other hand, particle recognition by differential image analysis lacks the required sensitivity of the particles that are dragged on because they move slowly and thus very slowly, so that the particles often show only slight differences between the different detector images.
    According to an exemplary embodiment, the determining device may be designed to use the same electromagnetic radiation source and the same electromagnetic radiation detector, in particular the same beam path or at least partially the same beam path, for the first and the second detection of the information. Thereby, the device can be made extremely compact. The formation of different optical paths for both determination methods or an expensive adjustment of the optical path when changing the investigation method is therefore unnecessary. In particular, beam forming optics may also be provided in common between the electromagnetic radiation source and the sample for both detection methods.
    According to an exemplary embodiment, the determining device may be designed to use at least partially the same detector data detected by the electromagnetic radiation detector for the first and the second detection of the information. This has the advantage, on the one hand, that the results of the two investigation methods are directly comparable with one another and that any differences can not result from different detector behavior in different measurements. On the other hand, this has the advantage that the amount of data to be processed and at least buffered is low, which guarantees low resource requirements and fast processing time.
    Finally, this advantageously allows to carry out a measurement in a short time, which also makes dynamic phenomena of the measurement accessible.
    According to an exemplary embodiment, the determining device may be configured to calculate and output a difference of particle sizes determined according to the first determination and of particle sizes determined according to the second determination. Especially with the at least partial use of identical detector data for both determination methods, this has the advantage that the differences in sensitivity resulting from the different physical principles of the two investigation methods provide additional information about the particles to be investigated. For example, when examining particles with a hard core and a flexible or movable, less dense envelope, particle detection can provide a particle diameter determined by the nucleus based on detector images. On the other hand, in the particle recognition by differential image analysis, the size including the envelope is recognized. A difference between the two determined particle sizes can thus provide the thickness of the shell.
    According to an exemplary embodiment, the determining device may be configured to carry out the particle size exclusively according to the first determination above a first predetermined size threshold and to carry out the particle size exclusively according to the second determination below a second predetermined size threshold value. Since particle detection becomes too inaccurate on the basis of detector images with too small particle sizes, in this size range the particle size determination can be carried out exclusively by the method of particle detection by differential image analysis. Conversely, with very large particle sizes, the particle size determination can be accomplished entirely by the particle detection method directly on the basis of individual detector images, since this detection is very accurate for large particles and the large
    Inertia of large particles in the method of particle detection by differential image analysis may suffer from the required accuracy.
    According to one embodiment, the first size threshold and the second size threshold may be identical so that only one of the two detection methods is used for each particle size. According to an alternative embodiment, the two size threshold values are different, wherein an evaluation with both methods can take place in the size range between the two size threshold values.
    According to an exemplary embodiment, the determining means may be arranged to carry out the particle size and particle shape exclusively according to the first determination below a first predetermined concentration threshold value of the sample and to carry out the particle size exclusively according to the second determination above a second predetermined concentration threshold value of the sample (the first concentration threshold value may be less than or equal to the second concentration threshold value ). Particle detection from detector images works well at low concentrations because then unwanted overlapping of different particles on a detector image is unlikely or does not occur. By contrast, at high concentrations, particles may overlap on the detector images, so that particle detection using detector images can no longer unambiguously distinguish whether there are only one large dimension particle or two (or more) closely spaced particles of smaller dimensions. At high concentrations, therefore, the device can resort to particle detection only by differential image analysis, where no accuracy reduction occurs with spatial overlap of different particles. Conversely, if the concentration of the particles in the sample becomes too low, the method of particle size determination by means of differential image analysis reaches its limits and can then be replaced by the particle size determination by the direct evaluation of detector images.
    According to an exemplary embodiment, the determining device may be configured to determine from the first and the second determination of the information with respect to the particle size information with regard to a viscosity of the sample. From the Stokes-Einstein relation, it is possible to determine the diffusion coefficient by means of the differential dynamic microscopy in particle sizes determined by means of the method of particle detection on the basis of detector images, which allows a conclusion on the viscosity of the sample at the known temperature.
    According to one exemplary embodiment, the apparatus may comprise electric field generating means for generating an electric field in the sample, the detecting means being arranged to determine indicative of the zeta potential of particles in the sample based on the secondary electromagnetic radiation detected in the sample in the presence of the electric field. Further, the detecting means may be configured to additionally determine the zeta potential from temporal variations between detector images generated from the electromagnetic secondary radiation at different detection times. When an electric field in the sample is switched on, an electrophoretic movement of the sample particles begins. From this, the zeta potential or the electrical charge of the particles can be determined, if the Differential Dynamic Microscopy is used.
    The electromagnetic radiation source can generate light in a desired wavelength range, preferably in the range of visible light (400 nm to 800 nm). Other wavelength ranges are possible, for example, infrared or ultraviolet. It is possible to make the electromagnetic radiation source as a laser. In this case, coherent light can be generated and used for the measurement. However, in other embodiments, the measurement may also be performed with non-coherent light. The latter may even be advantageous if interference artefacts are to be suppressed.
    According to an exemplary embodiment, the electromagnetic radiation source may be a pulsed radiation source. The use of a pulsed radiation source to generate short electromagnetic radiation pulses (for example spatially narrowed light packets) can clearly freeze particle motion in the sample so that a detector can then actually detect apparently static particles on the detector image. Then, utilizing an effect similar to that of stroboscopy, an open aperture can be detected.
    According to an exemplary embodiment, the apparatus may include primary beamforming optics between the electromagnetic radiation source and the sample, wherein the primary beamforming optics may be configured to collimate the primary electromagnetic radiation parallel to an optical axis. Such a collimator optics can advantageously be embodied identically for the particle recognition on the basis of the detector images and for the particle recognition on the basis of the difference image analysis, which leads to a low outlay on equipment and to a direct comparability of the two determination results.
    According to an exemplary embodiment, the device may comprise imaging optics between the sample and the electromagnetic radiation detector, wherein the imaging optics may be configured to image the electromagnetic secondary radiation onto the electromagnetic radiation detector.
    According to an embodiment, the imaging optics can be used identically for the two detection methods, resulting in a compact device and good comparability of the two detection results.
    According to an alternative embodiment, the apparatus may comprise a displacement mechanism adapted to adjust the imaging optics between different optical configurations for capturing detector data for first detection of the information and for recording
    Detector data is set up for the second determination of the information. As a result, an adjustment of the beam path to the respective determination method can be carried out in an optimized manner, without requiring a complete readjustment of the beam path in the transition from one of the investigation methods to the other.
    According to an exemplary embodiment, the adjustment mechanism may be a turret mechanism. A turret mechanism, by rotating a turret in which a plurality of alternately usable and different optical elements or optical assemblies are implemented, allows a respective desired optical element or optical assembly to be inserted into the optical path between the sample and the electromagnetic radiation detector, and thus for use in the Select device. A traversing mechanism that can be used alternatively to a retort mechanism is a slide mechanism that is displaceable in one direction, for example, to selectively retract two different optical elements or optical assemblies into the optical path.
    According to an exemplary embodiment, the adjustment mechanism may be configured to set a first imaging optic having a smaller numerical aperture than the second imaging optic for the second determination for the first determination. While a small numerical aperture is advantageous in particle recognition based on the evaluation of individual detector images, the resolution is higher in the case of particle recognition on the basis of the differential image analysis if the numerical aperture is larger. By the adjustment mechanism, a high accuracy in particle sizing can be achieved with a simple optical measure for both methods of determination.
    According to an exemplary embodiment, the first imaging optic may be a telecentric optic. Such a telecentric optic may include two lenses (especially two converging lenses) and optionally an aperture disposed therebetween. Thus, for telecentric optics, also lens systems can be implemented in which a diaphragm is dispensable.
    According to an exemplary embodiment, the second imaging optics may be a microscope objective, which may be implemented as a single lens, for example.
    According to an exemplary embodiment, the device may comprise a sample container containing the sample, which may be arranged horizontally. Such a sample container may be, for example, a cuvette. A lying arrangement of such a sample container can be realized, for example, by means of a suitable optical assembly, for example using deflecting mirrors. If the measuring cell is arranged horizontally, disturbing influences, such as, for example, particle sedimentation or the formation of temperature-induced flows in the measuring point, can be suppressed or eliminated.
    Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the following figures.
    Figure 1 shows an apparatus for determining indicative information for a particle size of particles in a sample and for determining a zeta potential of the particles according to an exemplary embodiment of the invention.
    Figure 2 shows a schematic illustration for evaluating detector images by Differential Dynamic Microscopy according to an exemplary embodiment of the invention.
    Figure 3 shows an Image Structure Function for a 70 nm PS latex particle in water taken with a 10x microscope objective with a numerical aperture of 0.25 obtained by Differential Dynamic Microscopy.
    Figure 4 shows a result of evaluation according to differential scanning microscopy on 46, 70 and 100 nm PS latex particles by the cumulant method.
    Figure 5 shows schematically the diffraction of light on a grating, wherein the angle of the first diffraction order depends on the wavelength of the incident light and the grating constant g.
    Figure 6 shows an Image Structure Function for a 500 nm PS latex particle in water taken with a conventional 40x microscope objective with a numerical aperture of 0.6 obtained by differential dynamic microscopy.
    FIG. 7 shows an apparatus for determining indicative information for a particle size of particles in a sample according to an exemplary embodiment of the invention.
    Figure 8 shows an apparatus for determining particle indicia of particles in a sample of indicative information according to another exemplary embodiment of the invention, wherein a horizontal measuring cell is provided for suppressing interfering influences, such as particle sedimentation or forming temperature-induced flows in the measuring cell.
    Figure 9 is a schematic block diagram of an apparatus for determining indicative information for a particle size of particles in a sample according to an exemplary embodiment of the invention.
    Figure 10 shows an apparatus for detecting a zeta potential of particles of a sample according to an exemplary embodiment of the invention.
    Figure 11 shows a schematic block diagram of an apparatus for determining a zeta potential of particles of a sample according to an exemplary embodiment of the invention.
    The same or similar components in different figures are provided with like reference numerals.
    Figure 1 shows an apparatus 100 for determining particle size and / or particle shape of particles in a sample 130 indicative information and determining a zeta potential of the particles according to an exemplary embodiment of the invention.
    The device 100 comprises an electromagnetic radiation source 102 formed as a pulsed laser, which is designed to generate pulses of electromagnetic primary radiation 108 (in this case optical light). The primary electromagnetic radiation 108 is directed onto a sample container 126. The sample 130 to be tested (for example, in a liquid-containing particle of the order of micrometers for ceramic production, for example titanium dioxide) flows through the sample container 126 formed here as a flow cell in a flow direction indicated by arrows 132, thereby interacting with the primary electromagnetic radiation 108, thereby transforming it into electromagnetic secondary radiation 110 is converted. The flow of the sample in the sample container 126 may optionally be inhibited prior to measurement with valves 133 and 134. Further, the sample container 126 may be configured to replace the flow cell with any cuvette, for example, to study sedimentation characteristics of the sample 130 or to preclude any sample change. An imaging optic 118 between the sample 130 and an electromagnetic radiation detector 104 (eg, a two-dimensional camera such as a CMOS camera or a CCD camera) is configured to image the electromagnetic secondary radiation 110 onto the electromagnetic radiation detector 104.
    The apparatus 100 includes a uniaxially displaceable adjustment mechanism 120 (see double-headed arrow) adapted to adjust the imaging optics 118 to receive first detection detector data (see reference numeral 112) of the information and to acquire detector data for second determination (see reference numeral 114) of the information. The adjustment mechanism 120 is configured to retract, for the first detection 112, a first imaging optic 124 in the optical path between the primary electromagnetic radiation 108 and the secondary electromagnetic radiation 110 having a smaller numerical aperture than a second imaging optic 122 for the second detection 114 in the optical path between the optical path electromagnetic primary radiation 108 and the secondary electromagnetic radiation 110 is retracted. The first imaging optic 124 is a telecentric optic. The second imaging optic 122 is a microscope objective. In this way, the imaging optics 118 can be adapted to the respective evaluation principle.
    The electromagnetic radiation detector 104 serves to detect the secondary electromagnetic radiation 110 in the form of two-dimensional detector images, which is generated by interaction of the primary electromagnetic radiation 108 with the sample 130.
    The detector data, which provide a two-dimensional image of the sample 130, are supplied to a detection means 106, for example, configured as a processor, which is arranged to determine the information indicative of the particle size based on the detected electromagnetic secondary radiation 110. To be more specific, the determining means 106 is arranged to determine the information firstly (see a reference path 112) by identifying and sizing the particles on a plurality of detector images generated from the secondary electromagnetic radiation 110, and secondly (see a separate evaluation path designated by reference numeral 114) from temporal Determine changes between detector images generated from secondary electromagnetic radiation 110 at different detection times. In other words, in the apparatus 100, the size determination of the particles can be made by means of a selectable or by means of two complementary procedures. The determination device 106 is designed to determine the information from the individual detector images generated from the secondary electromagnetic radiation 110 by means of dynamic image analysis (DIA) (see reference number 112). The determination means 106 is further adapted to determine the information from the temporal changes between the detector images by means of Differential Dynamic Microscopy (DDM) (see reference numeral 114).
    The determination device 106 is in particular configured to determine the first (see reference numeral 112) and the second (see reference numeral 114) determination of the information for at least a portion of a range between 100 nm and 20pm, i. twice to perform. In this area, both methods of detection are sensitive and, because of the complementary underlying physical principles, provide information that can not be determined by the other validation method.
    The determination device 106 is further configured to carry out the information for particle sizes above 20 pm only by means of the first determination (see reference symbol 112) and to carry out the information for particle sizes below 100 nm only by means of the second determination (see reference numeral 114), since the respective other determination method is described in FIGS The particle size ranges mentioned are not sufficiently sensitive.
    A controller 150 receives the detector data from the electromagnetic radiation detector 104 and forwards it to one or both branches for further processing (see reference numerals 112, 114). In this case, detector data can also be stored in a database 152.
    The storage medium may be any of computer readable storage media and / or storage media used by programmable logic circuitry, such as field programmable logic gate arrays (FPGAs), microcontrollers, digital signal processors (DSP), or the like. These storage media may be integrated directly into the device 100. For the first determination (see reference numeral 112) of the particle size distribution, i. the detection of particle sizes and / or particle shape directly on the basis of a camera image, the detector data are forwarded to a particle recognition unit 154, which detects individual particles on the individual detector images using methods of image processing (for example, pattern recognition based on reference data). The identified particles are forwarded to a parameter determining unit 156, which assigns a size and / or shape to the recognized ponds. For the second determination (see reference numeral 114) of the particle size distribution, i. the detection of particle sizes indirectly by generating camera difference images and deriving the particle sizes from a Fourier analysis, the detector data are first transmitted to a differential image detection unit 162. The
    Difference picture determination unit 162 determines the corresponding difference pictures from the detector data recorded at different times. The averaged difference images are Fourier transformed in a Fourier transform unit 164. An averaging unit 166 averages the results of the Fourier transform. A parameter determination unit 168 then determines the size distribution of the particles from the results of the determination.
    Combiner 170 may combine the results from the two determinations of reference numerals 112 and 114. The results of the analysis may be displayed on a display unit 180 to a user.
    The apparatus 100 further comprises an electric field generator 116 for generating an electric field in the sample 130, wherein the detector 106 is configured to detect the zeta potential of the particles of the sample 130 based on the detected secondary electromagnetic radiation 110. Controlled by the controller 150, a voltage source 177 of the electric field generating device 116 may apply an electric voltage between two opposing capacitor plates 179 of the electric field generating device 116. In this case, the arrangement of the electrodes 179 should be positioned so that the field lines of the electric field are normal to the direction of propagation of the primary electromagnetic radiation 108. In the case where the sample 130 also moves in a direction normal to the propagation direction of the primary electromagnetic radiation 108, the electrodes 179 should be arranged so that the field lines are normal to the flow direction of the sample and normal to the propagation direction of the primary radiation.
    Specifically, the detection means 106 is configured to detect the zeta potential or the electric charge of the particles from temporal changes between detector images generated from the secondary electromagnetic radiation 110 at different detection timings, i. using Differential Dynamic Microscopy. To determine the zeta potential from the detector data, the latter are fed to a zeta potential determination device 190, which can then forward the result of the evaluation to the display unit 180.
    Dynamic Image Analysis (DIA) is a method based on the photography of moving objects. The use in particle characterization is made possible by the development of very fast cameras and by the combination with pulsed light sources. Fast cameras are advantageous for being able to measure many particles in a short time for reasons of statistics. In addition, a pulsed light source allows the capture of very fast moving particles without any motion blur.
    Differential Dynamic Microscopy (DDM) can be performed with a commercially available optical microscope which illuminates the sample by means of an uncollimated white light source. However, the data analysis is not based on the evaluation of the images of the particles, but on the evaluation of the temporal changes of the structures on the image. Thus, the diffusion rate and, indirectly, the size of the particles can be determined. The method is not limited by the optical limit for the resolution of a single particle.
    The use of uncollimated white light is possible because with DDM, unlike DLS, the entire scattering vector | Q |, but only the projected scattering vector q is included in the calculations and is independent of the angle of incidence and the wavelength of the light. The latter can be seen as an advantage of the DDM over DLS since simulations have shown that for small scattering angles (<20 °, corresponding to forward scattering) the difference between q and | Q | is negligible.
    FIG. 2 shows a schematic 200 for evaluating detector images 202 using differential dynamic microscopy according to an exemplary embodiment of the invention. The sequence of a DDM measurement and evaluation described below is shown schematically in FIG.
    The particles in the liquid are photographed by means of an electromagnetic radiation detector 104 formed as a high speed camera, i. Intensity values I are acquired depending on the location coordinates x, y and the time t. By subtracting each of two images (see reference numeral 162), difference images 204 are generated. The time difference Δt between the detector images 202 to be subtracted is varied. Thus one obtains a whole series of difference images 204 which contain information about the dynamics of the system. The intensity in the difference images 204 is given by: = I {x, yf t4-At) -t)
    The difference images 204 are then Fourier-transformed (FFT (& i (xty; At)} - * see reference numeral 164, thereby
    Fourier transform 206 can be obtained. Since Brownian molecular motion is stochastic, the Fourier transform provides a rotationally symmetric image. can therefore be integrated over the azimuth angle.
    After performing the Fourier transform, averaging is performed, see reference numeral 166, whereby averaged Fourier transform 208 is obtained.
    The Fourier transform can be thought of as a decomposition of the object into refractive index gratings 500 with different grating pitch g, see Figure 5. The relationship between projected scattering vector (= grating vector) q and grating pitch g is given as follows: q = Ίπ / g
    The so-called Fourier power spectrum, also called Image StructureFunction 210, is given by:
    DiqtAt) = ( F (qf & 0 2) where g (q, M) is the intensity autocorrelation function, as also known from the DLS theory.
    Figure 3 shows D ^ q.At) for 70nm PS (polystyrene) latex particles in water taken with a 10x microscope objective.
    Thus, for example, the cumulant method (see
    Koppel, Dennis E. (1972), &quot; Analysis of Macromolecular Polydispersity in Intensity Correlation Spectroscopy: The Method of Cumulants &quot;, The Journal of Chemical Physics 57 (11): 4814) to calculate the particle size: Figure 4 shows a result of evaluation according to a measurement with Differential Dynamic Microscopy on 46nm, 70nm and 100nm PS latex particles by the cumulant method.
    By means of a DDM measurement, measurement data are already available for different q-vectors. The result corresponds to a large number of individual DLSE experiments, which were performed on these g-vectors (= scattering angles).
    Conventional methods for determining particle sizes have disadvantages which can be overcome by the measurement principle according to the invention:
    The dynamic image analysis (DIA) measuring range is limited by the optical resolution limit. This represents a significant disadvantage compared to competitive technologies such as static light scattering (SLS).
    Polydisperse samples containing particles below the optical resolution limit can not be fully characterized with DIA. The small parts of the size distribution function are lost.
    The particle concentration in DIA is limited by the condition that overlaps of particles on the captured images are very unlikely. It is not possible to distinguish random overlaps of particles from aggregates. The limit for the still measurable particle concentration depends on the imaging optics used, the detector used and the particle size itself.
    With Dynamic Image Analysis (DIA), only those parts of the particles that have a significant difference in refractive index to the solvent can be recognized. For example, heavily swollen polymer shells (steric stabilization) remain invisible. DIA provides a static image of the particles. Dynamic processes such as diffusion or electrophoretic motion are inaccessible.
    To at least partially overcome these disadvantages, exemplary embodiments of the invention have been developed:
    It has been recognized within the scope of the present invention that DIA and DDM have nearly identical measurement geometry requirements and therefore can be implemented in the same device. Also, the peripherals necessary for the operation of the meter are very similar.
    By combining the technologies, the measuring range can be significantly extended with regard to particle size. While the DIA is limited to small particle sizes by the optical resolution limit (smallest measurable particles should be at least about 100 nm, for example), DDM can still be measured far below (for example, up to about 20 nm). In the direction of large particles, DDM is limited by the diffusion movement, which becomes increasingly slower and hence more difficult to measure as the particle size increases. The upper measurement limit for DDM is about 10 pm particle size. The reason for this limitation is to be understood as follows. For example, it may well take several seconds for a particle as large as 10 μm to diffuse, for example, detectable by means of optical imaging. With such long measuring times, it becomes difficult to exclude interfering influences such as sedimentation or vibrations.
    The relatively large overlap in the measuring range between DIA and DMM (for example, about 500 nm to 10 pm) has the following advantages: While DIA directly evaluates an image of the particle, DDM is an indirect method in which the diffusion rate is determined from an image. For ideal dispersions of thinned, smooth spheres it is to be expected that the two determined diameters will agree. If there is an experimental discrepancy between the two results, this can be interpreted as the effect of a deviation from this ideal behavior. Therefore, valuable information about non-ideal behavior can be obtained from the combination of the two methods. The following is a concrete example:
    Sterically stabilized particles can give different results when tested with DIA and DDM. The optical contrast of the swollen polymer shell is extremely low compared to the contrast of the particle core. DIA accordingly provides the core diameter as a result. For DDM, the situation is completely different. The diffusion behavior is determined by the thermal energy and the flow resistance. The effective diameter in this case is core diameter plus twice the sheath thickness. After the shell moves with the particle, it effectively slows down the diffusion. From the combination of DIA and DDM, the thickness of the polymer shell is experimentally accessible (RSSm-sw). Neither DIA nor DDM can provide this information alone.
    In real samples, mixtures of very different particle sizes are often present. Many particle size determination methods can not determine the correct distribution of particle sizes from such mixtures. For example, dynamic light scattering DLS is greatly disturbed by low concentrations of large particles (eg, aggregates or dust). It is then no longer possible to determine the particle size of nano-particles, even if they are present in a much higher concentration. An important advantage of DDM over DLS is that it does not give such high sensitivity to large impurities in low concentration. In the course of the data evaluation, two pictures are taken from each other at different times, subtracted from each other. Very large particles move only extremely slowly, thus disappearing from the differential image. The contribution of the small particles, which diffuse quickly and therefore have significantly moved in the time between the two images, is not affected by the large particles. DDM thus allows the measurement of small particles in addition to very large particles. For DIA, nano-particles are outside the measuring range. Large particles are very well recognizable.
    The combination of DIA and DDM therefore results in complete characterization of samples with nanoparticles and small amounts of large particles. This would not be possible with a method alone. For DIA, it should be ensured that the particles do not overlap in the image. This can be achieved by a corresponding dilution.
    Size determination in samples with high particle concentrations is problematic. How high the particle concentration may be depends on the imaging optics, the detector and the particle size. In contrast, DDM works well at high concentrations and reaches its limit at low particle densities. The limitation to high concentrations is determined by the quasi-ideal dilution condition in the Stokes-Einstein equation. The combination of both technologies expands the concentration range in which correct measurements can be made. Usually, the Stokes-Einstein relationship is used to calculate the particle radius R from the diffusion coefficient D (given the viscosity η of the solvent, the Boltzmann constant ke and the absolute temperature T):
    However, the method of micro rheology uses the Stokes-Einstein relation in another form. It determines the viscosity η of the solvent from the diffusion coefficient:
    However, for this it is necessary to add particles of known size and thus possibly to change the sample. By combining DIA and DDM, it is possible to directly determine all the necessary input parameters. While the particle size can be taken directly from the images (DIA), the diffusion coefficient can be determined via DDM. The only requirement is that particles (of unknown size) are present in the overlap region of DIA and DDM.
    FIG. 7 shows an apparatus 100 for determining particle size indicia of particles in a sample 130 according to an exemplary embodiment of the invention. In order to eliminate the above-mentioned disadvantages of DIA technology by combining with DDM, the technology combination shown in Figure 7 can be used.
    The measurement arrangements for performing DIA and DDM are very similar, both technologies can share most of the components of the device 100, or even the entire components. The measurement arrangement in the form of the device 100 consists of a light source as electromagnetic radiation source 102, which emits a light beam as primary electromagnetic radiation 108 along an optical axis 702, a beamforming optics 700, a measuring cell as a sample container 126 containing the sample 130 to be examined, an imaging optics 118 and an image sensor as electromagnetic radiation detector 104. The entrance resp. Exit windows of the measuring cell are designated by reference numerals 704 and 706, respectively. The beamforming optics 700 serves for beam expansion or collimation, in order to produce a sharp image. It can be seen from FIG. 7 that the optical path length which the primary electromagnetic radiation 108 requires to pass through the sample container 126 is very short, in order to avoid adulteration in the sizing of particles located near the entrance window 704 and the exit window 706, respectively. FIG. 7 also shows that the imaging optics 118 are formed by two converging lenses 708, between which a diaphragm 710 is arranged (alternatively, a blindless lens system is also possible). The imaging optics 118 may be configured to always maintain the image at the same location as the electromagnetic radiation detector 104.
    With regard to the most suitable light source, DIA and DDM have practically identical requirements. Both technologies also work with coherent and polychromatic light. However, to suppress interfering interference artifacts in the images, an incoherent or weakly coherent light source is preferable. Since there is usually no
    Reason to include DIA pictures in color, the use of a monochromatic light source is in many cases quite sufficient. Monochromatic light even has many advantages. For example, aberrations caused by chromatic aberration are avoided and the relationship between the projected scattering vector q and the actual scattering vector | Q | is then unique (apart from angular dependence). In view of a good adjustability of the optical structure, with simultaneously high resolution, the shortest possible wavelength, which is still within the spectral range visible to the human eye, is to be preferred. Also, the use of a pulsed light source, as usual for DIA, is not a problem for DDM, or even an advantage, since only snapshots are needed with DDM.
    A further improvement in the quality of the captured images is achieved in the DIA by using collimated lighting. The beam shaping optics 700 thus aligns the light rays coming from the electromagnetic radiation source 102 parallel to the optical axis 702. This type of lighting is also of advantage for DDM. Since there are no more obliquely incident light rays on the object, the relationship between the projected scattering vector q and the actual scattering vector | Q | unique (apart from a wavelength dependency).
    Differences in the requirements of the construction of DIA and DDM devices exist especially in imaging optics 118. Since DIA is a method in which particles are measured directly on the basis of the images, perspective distortions, as in conventional, centric (and also pericentric) Optics occur, be avoided as possible. Thus, particles should appear the same size regardless of their distance to imaging optics 118. Although DIA is also possible with conventional optics, so-called telecentric optics are often used to image the particles onto the detector. However, these telecentric optics often have a low numerical aperture NA (especially when dealing with bi-telecentric imaging) DDM represents a limitation on the accessible q-range and the resolution. DDM comparison measurements with three different objectives (40x microscope objective with NA = 0.6, 10x microscope objective with NA = 0.25, 8x telecentric objective with NA = 0.09) have shown that the lOx microscope objective is best suited due to its optical parameters (magnification, NA and light intensity).
    Why this is so, one can imagine again with the decomposition of the object inperiodic refractive index gratings 500. The NA of optics limits this with respect to the angle at which a light beam can still enter the optics and contribute to the optical imaging. Figure 5 shows schematically the diffraction of light at a refractive index grating 500, wherein the angle of the first diffraction order depends on the wavelength of the incident light and the grating constant g. Since each lattice scatters the incident light to a certain angle Θ, depending on the lattice constant (see Figure 5, only the first order of diffraction is considered here), the NA also places a restriction in the lattice vectors g still receivable, and thus also because of q = 2n / g in the projected scattering vectors q. Therefore, if DDM is to cover the widest possible scattering range, it is advisable to use high numerical aperture imaging optics.
    But what determines the q-range shown in Figure 3 and its resolution in a typical DDM measurement To clarify, the magnification has M (with M> 1 for a magnifying map and M <1 for a shrinking map) of the imaging optics, the size of the PixelArray detector (assumption squared with m pixels of page length), and the size of the ones on it Pixels (square with edge length SP) are known. Assuming that the imaging optics is tuned to the pixel array detector, ie it is illuminated by the optics over the entire diagonal, the object-side field of view F, which can still be imaged on the detector by the imaging optics, results in:
    Since the g vector is given by q = 2n / g, and the smallest possible lattice in the image must have a lattice constant of two pixels, given by = ^ - = ^. For Figure 3 this results in a pixel edge length
    F of 14pm: = 2.24pw-1. Now, the q.max in Figure 3 is slightly larger than 3.
    The discrepancy comes from the diagonal of the Fourier-transformed image, which is larger by a factor than the width or height. This gives the correct value: = qmsx '/ i = 3.i7pn-1. However, measurement data on g values larger than should not be used for the evaluation because they contain no useable information about the image. The smallest possible g-value now becomes: «= 2mm.- - = 2.8β-3μ ^ _1 with an image width of m = 800 pixels.
    From the previous considerations, the following can be concluded:
    The usable g-vector range is limited in the context of the theory described herein above by the NA of the objective. That the scattering vector can be maximally so large that the first order of diffraction of the associated grating can still be picked up by the optics. = IfürA = i | = (n ... order of diffraction) iv -A Λ ·
    The usable g-vector range is also limited by the magnification of the imaging optics and the pixel size of the detector used, within the scope of the theory described herein. ip
    So the last point shows that optics with higher magnification makes a larger q-area accessible. However, it should also be considered here that the optics used can also dissolve the effective pixel size or can also transmit such small structures with sufficient contrast. This can be read off the modulation transfer function of the optics. For the example of FIG. 3 with NA = 0.25 and λ = 430ηηη, restriction 1 would yield a qβüsr.es-iimit = 3.653μ-ϊ »-1 and restriction 2 an onflT = 2.244μ «ι-1. Thus, the NA of the optics would not be the constraint in this case, since the g-region is already more limited by the chosen magnification and the size of the detector pixels. However, it should be kept in mind that a large g-range is not always advantageous because useful data is not measured at all g-values. The optics and the detector should therefore be selected so that only one g-range is recorded in which the measured data is also usable. FIG. 6 shows an example for this. Figure 6 shows an ImageStructure function for a 500 nm PS latex particle in water taken with a conventional 40x microscope objective with a numerical aperture of 0.6 obtained by Differential Dynamic Microscopy.
    The recorded g-range is large due to the strong magnifying lens, but useful measurement data are only available for a small g-range (for this measurement qmss = 8.98μ ΐ_1).
    In addition to the DDM measurement method, additional considerations will be described below:
    Smaller particles move faster compared to bigger ones, which leads to a clear difference signal in the DDM difference images. The mean distance s, by which a particle has moved away from the starting point after a certain time τ, can be expressed as the root of the mean square displacement (MSD): VMSD = = v'2Dt. In order to be able to measure larger particles with DDM, very small displacements should be measured.
    Looking at Figure 3 sections along the dt axis (these curves are proportional to the intensity correlation function), it will be noted that these curves for certain q values at large difference times dt (dt corresponds to the above-mentioned difference time Δt, which has elapsed between two subtracted images ) into a plateau. This plateau means that any correlation between the frames used for the difference image has been lost. Only when the curves turn into a plateau, can the characteristic decay time τ and subsequently the particle size be calculated. The g-dependence of the decay time is known from Dynamic Light Scattering and given by: τ = i / (Dmqa), where Dmdem is the mass diffusion coefficient of the particles. It is therefore also to be ensured that the measurement duration, and thus also the maximum delay time At available for the difference images, is adapted to the particle size (longer particles should be measured for larger particles).
    Particles in the Rayleigh limit represent so-called phase objects, scatter compared with larger ones so less in the forward direction. As the particle size decreases, the influence of the particles on the difference images decreases and eventually becomes so low that it goes under in the detector noise and thus can no longer be evaluated. The amplitude of the Image Structure FunctionD (q, At) is proportional to g4 for small q values.
    FIG. 8 shows an apparatus 100 for determining particle size indicia of particles in a sample 130 indicative of another exemplary embodiment of the invention, in which a sample container 126 or a measuring cell for suppressing interfering influences, such as particle sedimentation or the formation of temperature-induced flows in the sample The horizontal orientation of the sample container 126 is made possible by an arrangement of deflecting mirrors 800.
    Since the particles may only be subjected to Brownian molecular motion for size determination with DDM, it may be advantageous for large particles to carry out the measuring cell or sample container 126, for example, as shown in Figure 8. The effect of sedimentation and also the generation of undesired flows by temperature gradients (such as may be caused by a laser) is thus reduced.
    In the following, considerations for a DDM measurement in and of laminar flows are explained.
    If the diffusion movement is superimposed by a directed laminar flow, then a particle size determination by means of DDM is still possible. The rotational symmetry of the Fourier-transformed difference images is, however, broken, and integration over the azimuth angle is therefore no longer allowed. Only data derived from a motion perpendicular to the laminar flow should also be used for the DDM evaluation. Thus, much of the acquired measurement data can not be used for the evaluation, and the signal to noise ratio is correspondingly worse. then more measurement data should be recorded. However, DDM can not only be used to determine the particle size, but also to measure, for example, the flow rate of a suspension. The flow superimposed on the Brownian motion leads to a fringe pattern in the image structure function, which can be evaluated with regard to the fringe spacing and thus the flow velocity can be determined. For example, since the cause causing the flow is not critical to the flow measurement, electrophoretic mobility can also be measured by this method. From the electrophoretic mobility of particles then the zeta potential of the particles can be calculated. With DDM, it is thus possible to measure both particle size and zeta potential. Usually, multiple telecentric lenses are used for the DIA to cover a sufficiently large measurement range. Small particles should be magnified (typically 10-15x) to be detectable on the pixel array detector, whereas very large particles may even need to be downsized (typically factor two). For example, to make reproducible switching between different optics as convenient as possible, an optics turret may be substituted for the imaging optics 118 shown in Figs. 7 and 8. Thereby, the changing of the various optics may be performed manually or automatically.
    As already mentioned, it may be an advantage for DDM not to use telecentric optics but a conventional high NA objective lens. This can then also be built into the optics revolver.
    FIG. 9 shows a schematic basic arrangement of a device 100 for determining information indicative of a particle size of particles in a sample according to an exemplary embodiment of the invention.
    In addition to FIG. 7 and FIG. 8, a display unit 180, as well as a provision for sample dispersion and for discharging sample waste, are also advantageous for the operation of the combination device. Thus, for sample preparation and disposal, optionally, a sample dispersing unit 900 and a sample waste unit 902 may be incorporated into the apparatus 100.
    FIG. 10 shows a device 100 for determining a zeta potential. an electric charge state of particles of a sample 130 according to an exemplary embodiment of the invention.
    The device 100 according to FIG. 10 essentially differs from the device according to FIG. 7 in that an electric field generating device 116 is provided for generating an electric field in the sample 130, and that the determining device 106 is used for the detection device 106
    Determining the zeta potential of the particles in the sample 130 is formed exclusively by differential dynamic microscopy (DDM). On the other hand, the detecting means 106 is not necessarily configured to evaluate the detected data by dynamic image analysis detected by the electromagnetic radiation detector. For the remaining components, reference is also made to the other description in the context of this patent application.
    The device 100 according to FIG. 10 has an electromagnetic radiation source 102 for generating electromagnetic primary radiation 108. The apparatus 100 further includes the electric field generating means 116 for generating an electric field in the sample 130. An electromagnetic radiation detector 104 is for detecting secondary electromagnetic radiation 110 generated by interaction of the primary electromagnetic radiation 108 with the sample in the electric field. The determination device 106 is configured to determine the zeta potential based on the detected electromagnetic secondary radiation 110. Specifically, the detector 106 is configured to determine the zeta potential from temporal variations between detector images generated from the secondary electromagnetic radiation 110 at different detection timings, i. using Differential Dynamic Microscopy.
    FIG. 11 shows an associated schematic basic arrangement of a device 100 for determining a zeta potential of the particles according to an exemplary embodiment of the invention with a field generator 116. With regard to the additional components, reference is made to the above description of FIG.
    In addition, it should be noted that "having &quot; does not exclude other elements or steps and "a &quot; or "a &quot; no variety excludes. It should also be appreciated that features or steps described with reference to any of the above embodiments may also be used in combination with other features or steps of other embodiments described above. Reference signs in the claims are not intended to be limiting.
    权利要求:
    Claims (33)
    [1]
    Claims 1. An apparatus (100) for determining indicative information for a particle size and / or particle shape of particles in a sample, the apparatus (100) comprising: an electromagnetic radiation source (102) for generating electromagnetic primary radiation (108); an electromagnetic radiation detector (104) for detecting secondary electromagnetic radiation (110) generated by interaction of the primary electromagnetic radiation (108) with the sample; anda detecting means (106) arranged to determine the particle size and / or particle shape indicative information based on the detected secondary electromagnetic radiation (110); wherein the determining means (106) is adapted to determine the information selective first (112) by means of identification and sizing of the particles on a detector image generated from the electromagnetic secondary radiation (110), and / or the information (114) from temporal variations of the electromagnetic To determine secondary radiation (110) between detector images generated at different detection times.
    [2]
    The device (100) according to claim 1, wherein the determining device (106) is designed to determine the information from the detector image generated from the electromagnetic secondary radiation (110) by means of dynamic image analysis.
    [3]
    The apparatus (100) according to claim 1 or 2, wherein the determining means (106) is adapted to determine the information from the temporal changes between the detector images by means of differential dynamic microscopy.
    [4]
    4. Device (100) according to one of claims 1 to 3, wherein the determination device (106) is configured to determine both the first (112) and the second (114) information for at least one predeterminable partial range of particle sizes, in particular in a range between 100 nm and 20 pm, more particularly in a range between 500 nm and 10 pm.
    [5]
    5. Device (100) according to claim 4, wherein the determining device (106) is designed to perform the information for particle sizes above the predeterminable partial range of particle sizes only by means of the first determination (112) and / or the information for particle sizes below the predeterminable range of particle sizes only by means of the second determination (114).
    [6]
    6. Device (100) according to one of claims 1 to 5, wherein the determination device (106) is designed for the first (112) and the second (114) determination of the information the same electromagnetic radiation source (102) and / or the same electromagnetic radiation detector ( 104).
    [7]
    The apparatus (100) according to one of claims 1 to 6, wherein the determining means (106) is arranged to use at least in part the same detector data detected by the electromagnetic radiation detector (104) for the first (112) and second (114) detection of the information ,
    [8]
    The apparatus (100) according to one of claims 1 to 7, wherein the determining means (106) is arranged to calculate and output a difference between particle sizes determined according to the first determination (112) and determined particle sizes according to the second determination (114).
    [9]
    9. Device (100) according to one of claims 1 to 8, wherein the determining device (106) is designed to carry out the particle size exclusively according to the first determination (112) above a first predetermined size threshold and the particle size below a second predetermined size threshold exclusively according to the second determination (114). wherein the first size threshold is greater than or equal to the second size threshold.
    [10]
    The apparatus (100) according to one of claims 1 to 9, wherein the determining means (106) is arranged to carry out the particle size exclusively according to the first determination (112) below a first predetermined concentration threshold value of the sample and the particle size exclusively according to the second one above a second predetermined concentration threshold value of the sample Determining (114), wherein the first concentration threshold is less than or equal to the second concentration threshold.
    [11]
    The apparatus (100) according to one of claims 1 to 10, wherein the determining means (106) is adapted to determine information regarding a viscosity of the sample from the first (112) and the second (114) determination of the information regarding the particle size.
    [12]
    The apparatus (100) according to one of claims 1 to 11, comprising electric field generating means (116) for generating an electric field in the sample; wherein the determining means (106) is adapted to determine indicative information for the zeta potential of particles in the sample based on the secondary electromagnetic radiation (110) detected in the presence of the electric field in the sample.
    [13]
    The device (100) according to claim 12, wherein the determining device (106) is designed to determine the information indicative of the zeta potential of temporal changes between detector images generated from the electromagnetic secondary radiation (110) at different detection times, in particular by means of differential dynamic microscopy.
    [14]
    The apparatus (100) according to any one of claims 1 to 13, wherein the electromagnetic radiation source (102) is adapted to pulsed emission of the primary electromagnetic radiation (108).
    [15]
    The apparatus (100) according to one of claims 1 to 14, comprising primary beam shaping optics (700) between the electromagnetic radiation source (102) and the sample, the primary beam shaping optics (700) being arranged, the primary electromagnetic radiation (108) parallel to an optical axis (702 ) to collimate.
    [16]
    The apparatus (100) of any one of claims 1 to 15, comprising imaging optics (118) between the sample and the electromagnetic radiation detector (104), the imaging optics (118) being configured to image the electromagnetic secondary radiation (110) onto the electromagnetic radiation detector (104) ,
    [17]
    The apparatus (100) according to claim 16, comprising a manipulating mechanism (120) for particularly manually or automatically adjusting the imaging optics (118) between different optical configurations for capturing detector data for first detection (112) of the information and for capturing detector data for second detection (114 ) of the information is established.
    [18]
    18. Device (100) according to claim 17, wherein the adjusting mechanism (120) is a turret mechanism.
    [19]
    The apparatus (100) according to claim 17 or 18, wherein the manipulation mechanism (120) is arranged to set a first imaging optic (124) for the first determination (112) having a smaller numerical aperture than a second imaging optic (122) for the second determination (114).
    [20]
    The apparatus (100) according to claim 19, wherein the first imaging optic (124) comprises or consists of telecentric optics.
    [21]
    The apparatus (100) of claim 19 or 20, wherein the second imaging optic (122) comprises or consists of a microscope objective.
    [22]
    The apparatus (100) according to any of claims 1 to 21, comprising a sample container (126) receiving the sample, which is disposed horizontally.
    [23]
    23. A method for determining particle size and / or particle shape of particles in a sample of indicative information, the method comprising: generating electromagnetic primary radiation (108); Detecting secondary electromagnetic radiation (110) generated by interaction of the primary electromagnetic radiation (108) with the sample; and determining the information indicative of the particle size and / or particle shape based on the detected electromagnetic secondary radiation (110); wherein the information is selectively (112) first determined by means of identification and sizing and / or shape determination of the particles on a detector image generated from the secondary electromagnetic radiation (110), and / or secondarily (114) from temporal variations of the secondary electromagnetic radiation (110) between different detection times generated detector images is determined.
    [24]
    24. A storage medium, in particular a computer-readable storage medium, in which a program for determining particle size and / or particulate form of particles in a sample of indicative information is stored, which program, when executed by a processor (106), performs the method according to claim 23 or controls.
    [25]
    A software program for determining indicative information for a particle size and / or particulate form of particles in a sample, which software program, when executed by a processor (106), executes or controls the method of claim 23.
    [26]
    Apparatus (100) for determining indicative information indicative of a zeta potential of particles in a sample, the apparatus (100) comprising: an electromagnetic radiation source (102) for generating electromagnetic primary radiation (108); electric field generating means (116) for generating an electric field in the sample; an electromagnetic radiation detector (104) for detecting secondary electromagnetic radiation (110) generated by interaction of the primary electromagnetic radiation (108) with the sample in the electric field; and detecting means (106) arranged to determine the information indicative of the cell potential based on the detected secondary electromagnetic radiation (110); wherein the determination device (106) is designed to determine the information indicative of the zeta potential from temporal variations of the secondary electromagnetic radiation (110) between detector images generated at different detection times.
    [27]
    The apparatus (100) according to claim 26, wherein the determining means (106) is adapted to determine the zeta potential indicative information by means of differential dynamic microscopy.
    [28]
    The device (100) according to claim 26 or 27, wherein the electromagnetic radiation source (102) is adapted for pulsed emission of the primary electromagnetic radiation (108).
    [29]
    The apparatus (100) of any one of claims 26 to 28, comprising primary beam shaping optics (700) between the electromagnetic radiation source (102) and the sample, wherein the primary beamforming optics (700) is arranged to receive the primary electromagnetic radiation (108) parallel to an optical axis (702 ) to collimate.
    [30]
    The apparatus (100) of any one of claims 26 to 29, comprising imaging optics (118) between the sample and the electromagnetic radiation detector (104), wherein the imaging optics (118) is configured to image the electromagnetic secondary radiation (110) to the electromagnetic radiation detector (104) ,
    [31]
    31. A method of determining indicative information for a zeta potential of particles in a sample, the method comprising: generating electromagnetic primary radiation (108); Generating an electric field in the sample; Detecting secondary electromagnetic radiation (110) generated by interaction of the primary electromagnetic radiation (108) with the sample in the electric field; and determining the zeta potential indicative information based on the detected secondary electromagnetic radiation (110); wherein the information indicative of the zeta potential is determined from temporal variations of the secondary electromagnetic radiation (110) between detector images generated at different detection times.
    [32]
    32. A storage medium, in particular a computer-readable storage medium, in which a program for determining zeta potential of particles in a sample of indicative information is stored, which program, when executed by a processor (106), executes or controls the method of claim 31.
    [33]
    A software program for determining indicative information indicative of a zeta potential of particles in a sample, which software program, when executed by a processor (106), executes or controls the method of claim 31.
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    同族专利:
    公开号 | 公开日
    AT515577A3|2018-04-15|
    GB2539147A|2016-12-07|
    WO2015136038A2|2015-09-17|
    GB2539147B|2020-12-30|
    WO2015136038A3|2016-02-18|
    AT515577B1|2018-06-15|
    US20170074768A1|2017-03-16|
    DE112015001190A5|2016-12-01|
    GB201617320D0|2016-11-23|
    引用文献:
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    法律状态:
    优先权:
    申请号 | 申请日 | 专利标题
    ATA50184/2014A|AT515577B1|2014-03-12|2014-03-12|Common radiation path for determining particle information through direct image analysis and differential image analysis|ATA50184/2014A| AT515577B1|2014-03-12|2014-03-12|Common radiation path for determining particle information through direct image analysis and differential image analysis|
    US15/125,418| US20170074768A1|2014-03-12|2015-03-12|Common Radiation Path for Acquiring Particle Information by Means of Direct Image Evaluation and Differential Image Analysis|
    PCT/EP2015/055172| WO2015136038A2|2014-03-12|2015-03-12|Common radiation path for acquiring particle information by means of direct image evaluation and differential image analysis|
    GB1617320.5A| GB2539147B|2014-03-12|2015-03-12|Common beam path for determining particle-information by a direct image evaluation and by difference image analysis|
    DE112015001190.0T| DE112015001190A5|2014-03-12|2015-03-12|Common radiation path for determining particle information by means of direct image analysis and differential image analysis|
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